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UM E-Theses Collection (澳門大學電子學位論文庫)

Title

Non-scan Design For Testability of digital circuits based on Genetic Algorithm = 基於基因算法的數字電路非掃描可測性設計

Issue date

2002.

Author

Ng, Chi Long

Faculty

Faculty of Science and Technology

Department

Department of Electrical and Electronics Engineering

Degree

M.Sc.

Subject

Digital electronics

Integrated circuits

Genetic algorithms

Supervisor

Samandari, Farid

Mak, Peng Un

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Location
1/F Zone C
Library URL
991008391149706306